环境控制快速扫描原子力显微镜Environmental-control Fast Scan Atomic Force Microscope

型号:Cypher ES

Model: Cypher ES

主要技术指标

Specifications

噪音:

X,Y轴闭环噪音<60pm, Z轴闭环噪音<50pm,X,Y轴开环噪音<10pm, Z轴开环噪音<5pm;

变温范围:室温-250℃;

线扫描速度最高可不低于40Hz;

扫描模式:轻敲模式、接触模式、磁力显微镜、压电力显微镜、表面凯尔文探针显微镜、力曲线模式、纳米操纵、纳米刻蚀、双频共振追踪(DART),导电力显微镜

Noisy:

XY closed loop noisy<60pm,Z closed loop Noisy <50pm, XY open loop Noisy<10pm,Z open loop noisy< 5pm;

Temperature range : RT-250℃;

Line scan rate is up to 40Hz;

Scan mode:Tapping Mode,Contact Mode,MFM,PFM,SKPM,EFM,Nanolithography, Nanomanipulation, DART, CAFM

主要功能

Function:

可实现液体环境、气体环境和温度变化条件下对各类材料的微纳尺度性质和结构观察和分析;

广泛应用于各种材料,例如二维材料、陶瓷、金属、不导电材料、半导体器件、生物样品、磁性样品等的高分辨观察。

样品台移动范围180mm*180mm

样品尺寸 直径<15mm,厚度<5mm

定位检测噪声625Hz

全自动激光对探针和下针功能

Observing and analyzingsurface properties inmicro-nano levelof many kinds of material in gas/liquid/changing temperatureenvironment;

High resolution imaging of many kinds of material, e.g. Ceramics\Metal\

non-conductive materials\ semiconductor\

biological samples\

Magnetic Samples.